A FinFET is a three-dimensional transistor structure in which the gate wraps around a thin vertical silicon fin, providing better control of the channel than a planar transistor at reduced supply voltages. In advanced-node documentation, the term appears in process technology descriptions, PDK files, digital and mixed-signal standard cell libraries, and articles on short-channel effects, leakage reduction, and performance scaling.
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In localization work, FinFET appears in process node announcements, technology briefs, PDK documentation, standard cell datasheets, and academic or patent translations. It also occurs in EDA tool documentation for parasitic extraction, physical verification, and timing sign-off where compact device models must account for three-dimensional channel behavior and advanced-node process variation.
A frequent issue is translating FinFET as “fin field-effect transistor” with inconsistent use of “鳍片” or “鳍式,” or treating it as a generic transistor. Because FinFET denotes a specific architecture with different leakage, drive, and variability characteristics, inconsistent terminology in PDK or library documents can confuse engineers selecting models and corners.
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Japanese-to-Chinese documentation for a listed Japanese semiconductor manufacturer.
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