Leakage Current漏电流
Leakage current is the small, unintended current that flows through a transistor, diode, or isolation structure when the device is in its off state, due to carrier diffusion, defects, or quantum tunneling. It appears in device characterization reports, circuit simulation notes, and power-management documentation, where standby current, temperature dependence, and process-corner variation are analyzed side by side with active power.
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Where this term appears
Leakage current appears in device datasheets, simulation model documents, and low-power design reviews. It also occurs in test specifications that set standby current limits and in failure analysis reports for abnormal power draw. Translators need to distinguish electrical leakage current from leakage inductance or fluid leakage, and to preserve the distinction between off-state leakage and gate leakage.
Translation checks
A common error is translating leakage current as 'leakage' in a way that suggests a defect or safety hazard rather than a specified off-state current. In datasheets this can mislead readers into thinking the part is damaged. It is also mistaken for leakage inductance or leakage power, which confuses electrical parameters and can distort power-management documentation.
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