Design for Test可测试性设计
Design for test (DFT) is a design methodology that adds dedicated logic such as scan chains, boundary scan, and built-in self-test to make a chip easier to test after manufacturing. In test development documentation, DFT structures let automatic test equipment control and observe internal nodes, improving fault coverage and reducing test cost.
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Where this term appears
DFT appears in test pattern generation guides, ATPG tool manuals, and manufacturing test specifications. Translators encounter it in DFT insertion menus, scan configuration dialogs, test coverage reports, and documentation for boundary scan or BIST features. It also appears in design handoff documents between frontend and test engineering.
Translation checks
One common error is translating it as 'design for testing' and implying only test planning, or as 'testable design' and losing the embedded DFT methodology. In documentation, inconsistent use between '可测试性设计' and '测试设计' can confuse whether the text refers to RTL insertion, scan architecture, or test program strategy. That can lead to incorrect test setup in translated tool flows.
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