English–Chinese reference · Semiconductor

Critical Dimension关键尺寸

Critical dimension (CD) is the smallest feature size or linewidth that a fabrication process must control to achieve the intended electrical performance, typically specified in nanometers and measured after lithography or etch. In semiconductor documentation it appears in process specifications, metrology reports, statistical process-control charts, and design-rule checks where CD uniformity, bias, and target offsets are closely tracked.

Angel Translation editorial reference · Confirm the rendering against your source and approved project terminology.

TERM REFERENCE · PROJECT CHECK
EnglishCritical Dimension
Chinese (Simplified)关键尺寸
DomainSemiconductor

Check source meaning → confirm the preferred term → record approved variants and references.

Where this term appears

Critical dimension appears in process specifications, metrology recipes, OPC models, and design-rule documents. Translators encounter it when localizing fab measurement instructions, CD-SEM tool user interfaces, statistical process-control reports, and quality records, where CD values, target offsets, and uniformity metrics must remain numerically and terminologically consistent with source images.

Translation checks

A common mistake is expanding CD as compact disk or glossing it as critical distance, which is wrong in semiconductor metrology. Another issue is translating the abbreviation inconsistently with the full term, causing confusion in recipes and user interfaces where CD, linewidth, and target offset must correspond exactly to the drawings and data.

Keep the term aligned across your files

Technical terms need checking against the source, approved product terminology and related specifications. Keep units, parameter conditions and document versions aligned across the file set.

Provide approved terms and previous translations with the source files. Agree how variants, ambiguous wording and revisions will be reviewed. Terminology maintenance and any termbase handback are confirmed in the project scope. See the 8-step AI + expert workflow.

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A glossary entry is not an official standard or evidence of regulatory acceptance. Confirm current requirements for your project separately.