English–Chinese reference · Semiconductor

Photomask掩膜版

A photomask is a template that carries the circuit pattern to be transferred to a photoresist-coated wafer during lithographic exposure. Across mask-making and wafer-fab documentation, it appears in mask design specifications, mask shop instructions, lithography process documents, and reticle inspection reports where pattern fidelity, registration, and defect control are major concerns during wafer printing; in step-and-repeat tools it may be distinguished from a reticle.

Angel Translation editorial reference · Confirm the rendering against your source and approved project terminology.

TERM REFERENCE · PROJECT CHECK
EnglishPhotomask
简体中文掩膜版
DomainSemiconductor

Check source meaning → confirm the preferred term → record approved variants and references.

Where this term appears

Translators encounter photomask in mask design rules, mask shop work orders, and lithography instructions. It also appears in defect inspection and repair reports. The distinction between photomask and reticle matters when translating for step-and-repeat lithography, because the two are sometimes used interchangeably but can refer to different mask formats and exposure fields. Mask orders and tool messages require this distinction.

Translation checks

A frequent error is to translate photomask and reticle as the same Chinese term without considering the exposure system or wafer format. This can blur the distinction between full-wafer masks and smaller-field reticles used in steppers or scanners, causing confusion in mask orders, lithography setup, and inspection instructions. This is especially true in mask shop and scanner documentation.

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A glossary entry is not an official standard or evidence of regulatory acceptance. Confirm current requirements for your project separately.