Yield良率
In semiconductor manufacturing, yield is the ratio of functional dies or wafers that pass electrical and reliability screens to the total number fabricated under a given process, often reported for wafer sort, assembly, or final test. The term appears throughout production documentation, including wafer probe reports, defect-density analyses, binning summaries, yield-learning reviews, and cost models, where it serves as a key process-health and economic indicator.
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Where this term appears
'Yield' appears in foundry reports, test engineering documentation, product qualification decks, supply-chain summaries, and cost-review presentations. Localizers handle it when translating wafer-sort data, yield-by-die maps, excursion reports, and manufacturing KPI dashboards, where the word must remain '良率' rather than more general '产出' or '收益' in semiconductor contexts. Misreading this term as production output can distort quality conclusions.
Translation checks
A common error is translating 'yield' as 'output' or 'return' in manufacturing contexts, which obscures whether the metric measures quality or volume. Another issue is not distinguishing between wafer yield, die yield, and final test yield, especially in reports where different screens remove different portions of the population and each ratio must be labeled precisely.
Keep the term aligned across your files
Technical terms need checking against the source, approved product terminology and related specifications. Keep units, parameter conditions and document versions aligned across the file set.
Provide approved terms and previous translations with the source files. Agree how variants, ambiguous wording and revisions will be reviewed. Terminology maintenance and any termbase handback are confirmed in the project scope. See the 8-step AI + expert workflow.
Related document experience
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SMIC (Semiconductor Manufacturing International)
English ⇄ ChineseCorporate reporting and disclosure documentation, delivered across successive annual cycles.
Read the published project →Published scope shows related industry experience; it does not confirm that this specific term was used or reviewed in the project.
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